Large areas elemental mapping by ion beam analysis techniques

Elemental thin film depth profiles by ion beam analysis using simulated annealing—a new tool

Rutherford backscattering spectrometry (RBS) and related techniques have long been used to determine the elemental depth profiles in films a few nanometres to a few microns thick. However, although obtaining spectra is very easy, solving the inverse problem of extracting the depth profiles from the spectra is not possible analytically except for special cases. It is because these special cases ...

Using Ion-Beam Techniques to Determine the Elemental Composition of ICF Targets

LLE Review, Volume 75 171 The precise elemental composition of any inertial confinement fusion (ICF) target (capsule, flat foil, or a package attached to a hohlraum) must be known to interpret the results of the implosion. The accuracy of this information was never an issue in earlier experiments: the composition was well known because the targets were straightforward designs (i.e., glass capsu...

Ion beam analysis.

On the Corotational Beam Element Formulation in Large Deformation Analysis

This paper sheds more light on the co-rotational element formulation for beams with uniform cross-section. The co-rotational elements are commonly used in problems in which a structure undergoes a large deformation. In this study, the foregoing element obeys the Euler-Bernoulli beam assumptions. Unlike the formulations presented in the literature, in this paper, a number of local nodal coordina...

Analytical Techniques for Elemental Analysis of Minerals